A Special Talk with MTRL/SEM Technician Jacob Kabel
Thursday, October 16 12:00 Noon
Frank Forward 303
Abstract: This year’s Microscopy and Microanalysis conference showcased several interesting techniques applicable to the work we do here in Materials Engineering. Incremental improvements in energy dispersive detector technology have made novel detector configurations commercially viable. Cathode lens (or beam deceleration) systems have begun to work their way down from the high end field emission SEMs to conventional Tungsten filament systems. Transmission Kikuchi diffraction is now beginning to see widespread use with many commercial aids to analysis available.
I will be discussing the advantages and limitations of these techniques and how they may be applied to the work done in the department.
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